Title :
Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement
Author :
Wane, Sidina ; Ranaivoniarivo, Manohiaina ; Elkassir, Bilal ; Kelma, Christophe ; Gamand, Patrice
Author_Institution :
NXP-Semicond., Caen, France
Abstract :
This paper introduces the concept of cognitive wireless BIST system for reconfigurability of on-chip function blocks, towards contactless measurement and characterization of high frequency integrated systems. Proposed feasibility studies of cognitive BIST cover characterization of chip-to-chip noise interferences as function of wireless coupling-path attributes (wireless separation distance between emitter and receiver chips, injected power levels, Charge-Pump-Current). Study of BIST for reconfigurability of on-chip functions is conducted based on design of programmable automatic amplitude control (ALC) of PLL reference oscillators. Impacts of BIST circuits on system performances are evaluated based on simulation analysis and experimental verifications.
Keywords :
built-in self test; cognitive radio; electronic engineering computing; integrated circuit noise; oscillators; phase locked loops; programmable circuits; reconfigurable architectures; PLL reference oscillator; chip-to-chip noise interference characterization; cognitive built-in self-test; cognitive wireless BIST system; contactless measurement; emitter chip; programmable automatic amplitude control; receiver chip; reconfigurable on chip application; wireless coupling path; wireless separation distance; Built-in self-test; Oscillators; Phase locked loops; Semiconductor device measurement; System-on-a-chip; Wireless communication; Wireless sensor networks; Cognitive Radio(CR); Contactless Measurement; Software Defined Radio(SDR); Wireless BIST;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-8293-1
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2011.5940716
