Title :
A close encounter with Random Numbers
Author :
Das, Subrata ; Dasgupta, Parthasarathi ; Pandey, Amit ; Roy, Pabitra
Author_Institution :
Dept. of Inf. Technol., Acad. of Technol., Hooghly, India
Abstract :
Performance profiling or empirical testing, and statistical testing of algorithms for NP-complete problems is typically based on random sample testing. Random values constitute a good source of data for testing the effectiveness of a computer algorithm. Random number generation is an absolute proposition. As such, generally the concentration is on realistic pseudorandom number generation. There are numerous pseudorandom number generation algorithms. We propose here another drop in the sea which is at least as efficient as the existing algorithms and simpler in certain respects.
Keywords :
computational complexity; random number generation; random processes; statistical testing; NP-complete problem; empirical testing; performance profiling; pseudorandom number generation; random sample testing; statistical testing; Arrays; Generators; Noise; Prediction algorithms; Sections; Testing; Time complexity; Algorithms; arithmetic algorithms; pseudorandom number; random number;
Conference_Titel :
Computer, Communication, Control and Information Technology (C3IT), 2015 Third International Conference on
Conference_Location :
Hooghly
Print_ISBN :
978-1-4799-4446-0
DOI :
10.1109/C3IT.2015.7060206