DocumentCode
2019660
Title
Workflow Exception Forecasting Method Based on SVM Theory
Author
Hai-tao, Yuan ; Bin, Ding ; Zheng-xiao, Sun
Author_Institution
Sch. of Manage., Univ. of Sci. & Technol. of China, Hefei
Volume
1
fYear
2008
fDate
17-18 Oct. 2008
Firstpage
81
Lastpage
86
Abstract
Based on the analysis of workflow exceptions and Petri net theory, the study presents an extended modeling method, Label Petri net, which is used to describe workflow more accurately with state information. With these state information and data, a new method applying Support Vector Machine (SVM) theory is put forward to forecast workflow exceptions. This method can forecast overall and local exceptions and attempt to provide evidence for handling exceptions and developing flexible workflow system. Finally, a supply chain workflow system case about a packaging factory shows the application of Label Petri net modeling method and describes computing process of SVM theory to forecast exception. The calculation results show different effect with various kernel functions, which is explained in this thesis. And the study gives some advices to choose kernels of SVM algorithm. The case demonstrates feasibility and effectiveness of this method in forecasting workflow exception.
Keywords
Petri nets; forecasting theory; support vector machines; workflow management software; Petri net theory; SVM theory; exceptions handling; extended modeling method; flexible workflow system; label Petri net modeling; local exceptions; overall exceptions; packaging factory; state information; supply chain workflow system; support vector machine theory; workflow exception analysis; workflow exception forecasting; Computational intelligence; Kernel; Packaging machines; Predictive models; Sun; Supply chains; Support vector machines; Technology forecasting; Technology management; Workflow management software; Exception forecasting; Flexible workflow system; Label Petri net; Support Vector Machine (SVM);
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Design, 2008. ISCID '08. International Symposium on
Conference_Location
Wuhan
Print_ISBN
978-0-7695-3311-7
Type
conf
DOI
10.1109/ISCID.2008.66
Filename
4725562
Link To Document