DocumentCode :
2020141
Title :
Study on impacts of configuration parameters on flip stacked Au bumps stress and strain under random vibration load
Author :
Liangbin, Shao ; Chunyue, Huang ; Tianming, Li ; Ying, Liang ; Xingjin, Zhou
Author_Institution :
School of Electro-Mechanical Engineering, Guilin University of Electronic Technology, 541004, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
594
Lastpage :
597
Abstract :
The 3D finite element analysis model of flip stacked AU bumps was developed, its stress and strain distribution under random vibration load were analyzed by ANSYS the finite element analysis software. Solder joint height, solder maximum radial size, solider distribution were selected as four key configuration parameters, their impacts on the models´ stress and strain distribution were also studied, the results showed that: under random vibration load, the bumps array maximum stress and strain appeared on the farthest position away from the center of the array of bumps, with the increase of the bump height/diameter in distribution, the maximum stress and strain decrease gradually.
Keywords :
Analytical models; Gold; Lead; Load modeling; Reliability; Strain; Tin; finite element analysis; flip stacked Au bumps; random vibration analysis; stress and strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236657
Filename :
7236657
Link To Document :
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