DocumentCode
2020141
Title
Study on impacts of configuration parameters on flip stacked Au bumps stress and strain under random vibration load
Author
Liangbin, Shao ; Chunyue, Huang ; Tianming, Li ; Ying, Liang ; Xingjin, Zhou
Author_Institution
School of Electro-Mechanical Engineering, Guilin University of Electronic Technology, 541004, China
fYear
2015
fDate
11-14 Aug. 2015
Firstpage
594
Lastpage
597
Abstract
The 3D finite element analysis model of flip stacked AU bumps was developed, its stress and strain distribution under random vibration load were analyzed by ANSYS the finite element analysis software. Solder joint height, solder maximum radial size, solider distribution were selected as four key configuration parameters, their impacts on the models´ stress and strain distribution were also studied, the results showed that: under random vibration load, the bumps array maximum stress and strain appeared on the farthest position away from the center of the array of bumps, with the increase of the bump height/diameter in distribution, the maximum stress and strain decrease gradually.
Keywords
Analytical models; Gold; Lead; Load modeling; Reliability; Strain; Tin; finite element analysis; flip stacked Au bumps; random vibration analysis; stress and strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location
Changsha, China
Type
conf
DOI
10.1109/ICEPT.2015.7236657
Filename
7236657
Link To Document