• DocumentCode
    2020141
  • Title

    Study on impacts of configuration parameters on flip stacked Au bumps stress and strain under random vibration load

  • Author

    Liangbin, Shao ; Chunyue, Huang ; Tianming, Li ; Ying, Liang ; Xingjin, Zhou

  • Author_Institution
    School of Electro-Mechanical Engineering, Guilin University of Electronic Technology, 541004, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    594
  • Lastpage
    597
  • Abstract
    The 3D finite element analysis model of flip stacked AU bumps was developed, its stress and strain distribution under random vibration load were analyzed by ANSYS the finite element analysis software. Solder joint height, solder maximum radial size, solider distribution were selected as four key configuration parameters, their impacts on the models´ stress and strain distribution were also studied, the results showed that: under random vibration load, the bumps array maximum stress and strain appeared on the farthest position away from the center of the array of bumps, with the increase of the bump height/diameter in distribution, the maximum stress and strain decrease gradually.
  • Keywords
    Analytical models; Gold; Lead; Load modeling; Reliability; Strain; Tin; finite element analysis; flip stacked Au bumps; random vibration analysis; stress and strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236657
  • Filename
    7236657