• DocumentCode
    2020355
  • Title

    Radiation analysis of embedded capacitor based on HFSS

  • Author

    Ying, Liang ; Chunyue, Huang ; Liangbin, Zhang Long Shao ; Wei, Huang ; Tianming, Li

  • Author_Institution
    Department of Electronic Engineering, Chengdu Aeronautic Vocational and Technical College, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    631
  • Lastpage
    633
  • Abstract
    The simulation model of embedded capacitor radiation was established based on HFSS (High Frequency Simulator Structure) software in this paper. Radiation problem of the embedded capacitor at high frequency was studied by the model. Its near-field radiant power gain was obtained and the effects of the variations of the signal frequency, capacitance plate radius and dielectric thickness on radiation power gain were analyzed. The analysis results are shown as follows:near-field radiation power gain of embedded capacitor changes accordingly with the change of the signal frequency; within a certain range of electrode plate radius, radiation power increases with the increase of electrode plate radius; and in a certain range of dielectric thickness, near-field radiation power decreases with the increase of dielectric thickness.
  • Keywords
    Analytical models; Dielectrics; Packaging; HFSS simulation; dielectric thickness; electrode plate radius; embedded capacitor; near-field radiant power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236665
  • Filename
    7236665