Title :
Packaging and Feedthrough Modes of Wafer Level for RF MEMS Switches
Author :
Wu, Qun ; He, Xun-jun ; Jin, Bo-shi ; Song, Ming-Xin ; Yin, Jing-Hua
Author_Institution :
Sch. of Electron. & Inf. Technol., Harbin Inst. of Technol.
Abstract :
This paper reports on the methods, feedthrough modes and RF performance of wafer level packaging for RF MEMS switches. By analyzing the effects of packaging methods and feedthrough modes on the cost, weight, size, loss, RF performance and function of switches, a novel wafer level packaging structure which is performed using the wafer-level microencapsulation on the thin silicon substrate as the RF MEMS switches wafer with the vertical feedthroughs is presented. This structure has some advantages, such as low thickness, low parasitic capacity, short electric path, lightweight, no real ring and compatibility with the devices fabrication processes. Therefore, for RF applications, the packaging structure obviously reduces electric path loss and fabrication cost, and provides better RF performance of RF MEMS switches
Keywords :
encapsulation; microswitches; silicon; wafer level packaging; RF MEMS switches; electric path loss; feedthrough modes; vertical feedthroughs; wafer level packaging method; wafer-level microencapsulation; Cost function; Fabrication; Packaging; Performance analysis; Performance loss; Radio frequency; Radiofrequency microelectromechanical systems; Silicon; Switches; Wafer scale integration; Packaging; RF MEMS; Switches; Wafer Level;
Conference_Titel :
RF and Microwave Conference, 2006. RFM 2006. International
Conference_Location :
Putra Jaya
Print_ISBN :
0-7803-9744-4
Electronic_ISBN :
0-7803-9745-2
DOI :
10.1109/RFM.2006.331061