Title :
A multipole-accelerated boundary-element approach to transient simulations of three-dimensional integrated circuit interconnect
Author :
Chou, M. ; White, J.K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
It has recently been shown that accurate electro-quasistatic, or transient interconnect, analysis for three-dimensional structures can be performed using the same surface discretization used for ordinary capacitance extraction. In this paper we describe how to use multipole-accelerated, iterative algorithms to reduce the computational complexity of surface-discretization based transient interconnect analysis from order N3 to order N, where N is the number of surface unknowns
Keywords :
transient analysis; capacitance; computational complexity; electro-quasistatic analysis; iterative algorithm; multipole-accelerated boundary-element method; surface discretization; three-dimensional integrated circuit interconnect; transient simulation; Analytical models; Circuit simulation; Computational modeling; Conductors; Integrated circuit interconnections; Integrated circuit modeling; Iterative algorithms; Laplace equations; Solid modeling; Transient analysis;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594078