DocumentCode :
2020851
Title :
Study on the impact of height of solder joints with compliant layer on stress and strain under thermal cycle
Author :
Xingjin, Zhou ; Chunyue, Huang ; Tianming, Li ; Ying, Liang ; Liangbin, Shao
Author_Institution :
School of Electro-Mechanical Engineering, Guilin University of Electronic Technology, 541004, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
705
Lastpage :
710
Abstract :
The 3D finite element analysis model of chip scale package solder joints with compliant layer was established, the thermal-structure finite element analysis of the model was performed, the stress and strain distribution of the solder joints with complaint layer was obtained under the condition of thermal-structure, the influences of the height of solder joints with complaint layer structure were studied. Results shows that the compliant layer structure can reduce the stress and strain of solder joints effectively. With the increase height of solder joints with complaint layer, the maximum stress and strain of the solder joints decrease.
Keywords :
DRAM chips; Joints; Military standards; Silicon; Strain; Thermal expansion; Thermal loading; finite element analysis; solder joints height; solder joints with complaint layer; stress and strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236682
Filename :
7236682
Link To Document :
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