DocumentCode :
2021211
Title :
Effect of a nonplanar wavefront in spotlight-mode synthetic aperture radar
Author :
Lee, Jung Ah ; Munson, David C., Jr.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
1
fYear :
1994
fDate :
13-16 Nov 1994
Firstpage :
481
Abstract :
The tomographic formulation of spotlight-mode synthetic aperture radar (SAR) is based on a plane-wave assumption that requires the dimension of the target scene to be much smaller than the range to the target. When this assumption is violated, the resulting image exhibits target smearing and target shift. For severely squinted SAR operation, which arises in runway imaging (for aircraft landing applications), the authors have observed that the smearing is not serious, but that targets are shifted considerably from their correct locations, especially for targets near the edges of the scene. They analyze this problem by first deriving an expression for the spatial shift of a reconstructed point reflector for bandpass Fourier data with phase error. Then, they analyze the point target shift in squint-mode SAR, by incorporating the higher-order terms of the range function. Simulation results for isolated point reflectors are presented
Keywords :
airborne radar; aircraft landing guidance; image reconstruction; radar applications; radar imaging; synthetic aperture radar; tomography; aircraft landing; bandpass Fourier data; higher-order terms; isolated point reflectors; nonplanar wavefront; phase error; plane-wave assumption; point target shift; range function; reconstructed point reflector; runway imaging; spatial shift; spotlight-mode synthetic aperture radar; squint-mode SAR; target scene; target shift; target smearing; tomographic formulation; Aerospace electronics; Fourier transforms; Frequency; Image reconstruction; Interpolation; Layout; Reflectivity; Signal resolution; Synthetic aperture radar; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-6952-7
Type :
conf
DOI :
10.1109/ICIP.1994.413360
Filename :
413360
Link To Document :
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