DocumentCode :
2021297
Title :
Physics-based simulation of field-plate effects on substrate- and surface-related current slump in GaAs FETs
Author :
Tanaka, T. ; Itagaki, K. ; Nakajima, A. ; Horio, K.
Author_Institution :
Fac. of Syst. Eng., Shibaura Inst. of Technol., Saitama, Japan
fYear :
2009
fDate :
28-29 Sept. 2009
Firstpage :
164
Lastpage :
167
Abstract :
Two-dimensional transient simulation of GaAs FETs with a field plate is performed in which substrate traps and surface states are considered. Quasi-pulsed I-V curves are derived from the transient characteristics. It is studied how the existence of field plate affects slow current transients and current slump due to substrate traps and surface states. It is shown that both the substrate-related and surface state-related transients and current slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness under the field plate to reduce the current slump and also to maintain high frequency performance of GaAs FETs.
Keywords :
III-V semiconductors; field effect transistors; gallium arsenide; surface states; FET; GaAs; current transients; field plate effects; field-plate length; insulator thickness; quasipulsed I-V curves; substrate-related current slump; surface states; surface-related current slump; two-dimensional transient simulation; Circuit simulation; Current slump; Energy states; FETs; Gallium arsenide; Modeling; Passivation; Poisson equations; Substrates; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4749-7
Type :
conf
Filename :
5296293
Link To Document :
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