• DocumentCode
    2021297
  • Title

    Physics-based simulation of field-plate effects on substrate- and surface-related current slump in GaAs FETs

  • Author

    Tanaka, T. ; Itagaki, K. ; Nakajima, A. ; Horio, K.

  • Author_Institution
    Fac. of Syst. Eng., Shibaura Inst. of Technol., Saitama, Japan
  • fYear
    2009
  • fDate
    28-29 Sept. 2009
  • Firstpage
    164
  • Lastpage
    167
  • Abstract
    Two-dimensional transient simulation of GaAs FETs with a field plate is performed in which substrate traps and surface states are considered. Quasi-pulsed I-V curves are derived from the transient characteristics. It is studied how the existence of field plate affects slow current transients and current slump due to substrate traps and surface states. It is shown that both the substrate-related and surface state-related transients and current slump are reduced by introducing a field plate. It is suggested that there are optimum values for field-plate length and insulator thickness under the field plate to reduce the current slump and also to maintain high frequency performance of GaAs FETs.
  • Keywords
    III-V semiconductors; field effect transistors; gallium arsenide; surface states; FET; GaAs; current transients; field plate effects; field-plate length; insulator thickness; quasipulsed I-V curves; substrate-related current slump; surface states; surface-related current slump; two-dimensional transient simulation; Circuit simulation; Current slump; Energy states; FETs; Gallium arsenide; Modeling; Passivation; Poisson equations; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-4749-7
  • Type

    conf

  • Filename
    5296293