• DocumentCode
    2021379
  • Title

    Physics-Based Simulation of Carrier Velocity in 2-Dimensional P-Type MOSFET

  • Author

    Riyadi, Munawar Agus ; Ahmadi, Mohammad Taghi ; Suseno, Jatmiko E. ; Siew, Kang Eng ; Saad, Ismail ; Ismail, Razali ; Arora, Vijay K.

  • fYear
    2009
  • fDate
    25-29 May 2009
  • Firstpage
    735
  • Lastpage
    738
  • Abstract
    The carrier velocity for 2-dimensional (2-D) p-type nanostructure was simulated in this paper. According to the energy band diagram, the effective mass (m*) in the p-type silicon is mostly dominated by heavy hole because of the large gap between heavy hole and light hole in k = 0. The carrier concentration calculation for 2-D, based on the Fermi-Dirac statistic on the order of zero (F0 ), was applied to obtain the intrinsic velocity of carrier, in the term of thermal velocity vth. The results for 2-D carrier velocity were modeled and simulated, and the comparison for degenerate and non-degenerate regime is presented for various temperature and concentration. It is revealed that the velocity is strongly dependent on concentration and becomes independent of temperature at high concentration.
  • Keywords
    MOSFET; carrier mobility; circuit simulation; fermion systems; quantum statistical mechanics; 2-dimensional p-type MOSFET; 2-dimensional p-type nanostructure; 2D carrier velocity; Fermi-Dirac statistic; carrier concentration calculation; energy band diagram; physics-based simulation; Analytical models; Asia; Carrier confinement; Effective mass; MOS devices; MOSFET circuits; Matter waves; Nanoscale devices; Statistics; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modelling & Simulation, 2009. AMS '09. Third Asia International Conference on
  • Conference_Location
    Bali
  • Print_ISBN
    978-1-4244-4154-9
  • Electronic_ISBN
    978-0-7695-3648-4
  • Type

    conf

  • DOI
    10.1109/AMS.2009.26
  • Filename
    5072079