Title :
Refractive index, capture rate and sensitivity of quantum dot lasers to optical feedback
Author :
Huyet, Guillaume ; O´Brien, Dominic ; Carroll, Olwen ; Hegarty, Stephen ; Houlihan, John ; McInerney, J.G. ; Muszalski, J. ; Corbett, B. ; Uskov, A.V.
Author_Institution :
Phys. Dept., Nat. Univ. of Ireland, Cork, Ireland
Abstract :
The line-width enhancement factor and the relative intensity noise spectrum of quantum dot semiconductor lasers were measured. The sensitivity to optical feedback of quantum dot semiconductor lasers was compared to quantum well semiconductor lasers. A reduced sensitivity of 20 dB compared to quantum well semiconductor lasers was observed. Rate equations describing the capture of carriers from the quantum well into the dots was used as basis in providing an explanation for the reduced sensitivity to optical feedback.
Keywords :
electron traps; hole traps; laser feedback; laser noise; quantum dot lasers; quantum well lasers; refractive index; carrier capture; line-width enhancement factor; optical feedback sensitivity; quantum dot lasers; quantum well semiconductor lasers; refractive index; relative intensity noise spectrum; Laser feedback; Laser noise; Noise measurement; Optical feedback; Optical noise; Quantum dot lasers; Quantum well lasers; Refractive index; Semiconductor device noise; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363426
