Design of GLFSR based test processor chip

Author

Kabir, Mohammod Akbar ; Ali, Liakot

Author_Institution

Dept. of Econ., Univ. of Dhaka, Dhaka, Bangladesh

fYear

2009

fDate

16-18 Nov. 2009

Firstpage

234

Lastpage

237

Abstract

The key components of all electronic equipment are integrated circuits (ICs). Due to the improvement of integration technology, the complexity of such circuit is increasing rapidly. It has become a challenge to test ICs with reliable performance in respect to storage requirement, test application time and fault coverage. In this paper we investigate the performance of Generalized Linear Feedback Shift Register (GLFSR) based test processor implementing mixed-mode testing technique. It is shown that GLFSR based Test processor performs better in testing of IC.

Keywords

circuit complexity; circuit feedback; fault simulation; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; shift registers; GLFSR based test processor chip; IC testing; circuit complexity; electronic equipment; fault coverage; generalized linear feedback shift register; integrated circuit; integration technology; mixed-mode testing; reliable performance; storage requirement; test application time; Decision support systems; Testing; ATE; CUT; GLFSR; IC; PRV;

fLanguage

English

Publisher

ieee

Conference_Titel

Research and Development (SCOReD), 2009 IEEE Student Conference on

Conference_Location

UPM Serdang

Print_ISBN

978-1-4244-5186-9

Electronic_ISBN

978-1-4244-5187-6

Type

conf

DOI

10.1109/SCORED.2009.5443091

Filename

5443091