Title :
High gain 110-GHz low noise amplifier MMICs using 120-nm metamorphic HEMTs and coplanar waveguides
Author :
Bessemoulin, A. ; Fellon, P. ; Gruenenpuett, J. ; Massler, H. ; Reinert, W. ; Kohn, E. ; Tessmann, A.
Author_Institution :
United Monolithic Semicond. S.A.S, Orsay, France
Abstract :
This paper presents the design and performance of 110-GHz low noise amplifier MMICs, based on coplanar technology, and utilizing 120-nm gate-length metamorphic HEMTs. Thanks to a cascode device, a single-stage amplifier achieves 8-dB small signal gain, with less than 4-dB noise figure at 105 GHz, within a chip size of only 0.725 mm/sup 2/. The 2- and 3-stage LNAs exhibit small signal gains of more than 15- and 22-dB, respectively over the 100-115 GHz frequency range, with associated measured noise figures of 4.5 dB at 105 GHz; the chip area for these circuits are less than 2- and 3 mm/sup 2/. To the author´s knowledge, these results are amongst the lowest noise figures reported to date for uniplanar amplifier MMICs operating at these frequencies.
Keywords :
HEMT integrated circuits; MMIC amplifiers; coplanar waveguides; low noise amplifiers; millimetre wave amplifiers; 100 to 115 GHz; 4 dB; 4.5 dB; 8 dB; LNA; coplanar waveguides; low noise amplifier MMIC; metamorphic HEMT; single-stage amplifier; Area measurement; Coplanar waveguides; Frequency measurement; Gain measurement; Low-noise amplifiers; MMICs; Noise figure; Noise measurement; Semiconductor device measurement; mHEMTs;
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7