Title :
Development and hardware implementation of a fault transients recognition system
Author :
Perera, N. ; Rajapakse, A.
Author_Institution :
Univ. of Manitoba, MN, USA
Abstract :
Summary form only given. This paper presents the development and hardware implementation of a classification scheme to distinguish the transients originated by faults from the other types of transients. In the proposed scheme, a set of Hidden Markov Model (HMM) based classifiers are employed to recognize the fault transients. Input features for the classifiers are the energy contained in wavelet coefficients of the measured current waveforms. A laboratory prototype of the fault recognition system was implemented on a floating point Digital Signal Processor (DSP) based hardware platform. The classification system was tested using the transient signals generated by a real-time waveform playback unit. The test waveforms were generated by simulating an actual extra high voltage (EHV) transmission system on an electromagnetic transient (EMT) simulation program. Operation of the classification system was further verified using waveforms obtained from an actual fault recorder. The performance of the classifier was investigated under different practical scenarios such as current transformer saturation, measurement noise and lightning faults.
Keywords :
digital signal processing chips; hidden Markov models; power transmission faults; EHV transmission system; EMT simulation program; HMM-based classifiers; classification scheme; classification system; current transformer saturation; electromagnetic transient simulation program; extrahigh-voltage transmission system; fault recorder; fault transient recognition system; floating point DSP-based hardware platform; floating point digital signal processor; hardware implementation; hidden Markov model-based classifiers; lightning faults; measured current waveforms; measurement noise; real-time waveform playback unit; transient signals; wavelet coefficient; Current measurement; Energy measurement; Hardware; Hidden Markov models; Laboratories; Transient analysis; Wavelet coefficients;
Conference_Titel :
Power and Energy Society General Meeting, 2012 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-2727-5
Electronic_ISBN :
1944-9925
DOI :
10.1109/PESGM.2012.6343954