DocumentCode
2023036
Title
A rigorous full-wave analysis of electrical interconnects for VLSI packages
Author
Gedney, Stephen D.
Author_Institution
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fYear
1994
fDate
2-4 Nov 1994
Firstpage
73
Lastpage
75
Abstract
A rigorous analysis of electrical interconnects of VLSI packages using the planar generalized Yee-algorithm is presented. The highly efficient algorithm is based on the discretization of the time-dependent Maxwell´s equations using unstructured grids, and is demonstrated as being capable of accurately modeling large interconnect networks with complex geometries
Keywords
VLSI; VLSI packages; discretization; electrical interconnects; full-wave analysis; interconnect networks; planar generalized Yee-algorithm; time-dependent Maxwell equations; Finite difference methods; Integrated circuit interconnections; Magnetic analysis; Packaging; Predictive models; Pulsed power supplies; Sparse matrices; Time domain analysis; Transmission lines; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location
Monterey, CA
Print_ISBN
0-7803-2411-0
Type
conf
DOI
10.1109/EPEP.1994.594086
Filename
594086
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