Title :
Effects of discontinuities (vias) on high speed interconnects
Author :
Venkataraman, Srinivas ; Prince, John L. ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
Vias and bends are commonly encountered as nonuniformities along traces of interconnect on high performance multichip modules. The extent of degradation of signal propagation characteristics due to the presence of discontinuities has been investigated by developing and using a simulator based on the transmission (ABCD) matrix parameters, which facilitates concatenation of many transmission line systems. The approach models the reactive energy stored in a discontinuity as a lumped tee-network using three dimensional parameter extractors. A case study on the thick film geometry of the IBM ES9000 module investigates the effects of vias on propagation delay time, signal distortion, characteristic impedance and additional noise generated due to reflections at the termination and at the source for different input rise times
Keywords :
transmission line matrix methods; IBM ES9000 module; bends; characteristic impedance; degradation; delay time; discontinuities; distortion; high speed interconnects; lumped tee-network; multichip modules; noise; reactive energy; signal propagation; simulator; thick film; three dimensional parameter extractors; transmission line systems; transmission matrix; vias; Degradation; Distortion; Geometry; Impedance; Multichip modules; Noise generators; Propagation delay; Thick films; Transmission line discontinuities; Transmission line matrix methods;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594087