Title :
Multiport de-embedding technique for balanced varactor high frequency characterization
Author :
Morandini, Y. ; Debroucke, R. ; Larchanche, J.-F. ; Jan, S. ; Boret, S. ; Gloria, D. ; Pekarik, J.
Author_Institution :
IBM, Crolles, France
fDate :
Sept. 29 2009-Oct. 1 2009
Abstract :
The present work proposes a simple Pad/Thru de-embedding method for multiport S-parameter measurements of differential varactors. The Pad/Thru method is compared to Open/Short de-embedding and leads to the following strengths: reduction of the wafer area required for dummy structure and reduction of the number of measurements required to characterize and de-embed each devices.
Keywords :
S-parameters; varactors; balanced varactor high frequency characterization; differential varactor; dummy structure; multiport S-parameter measurement; multiport deembedding technique; open/short deembedding; simple pad/thru deembedding method; Atherosclerosis; CMOS technology; Fingers; Impedance; Measurement errors; Plugs; Probes; Radio frequency; Testing; Varactors; characterization; de-embedding; differential; high frequency; muliport; varactor;
Conference_Titel :
Microwave Conference, 2009. EuMC 2009. European
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4748-0
