• DocumentCode
    2023669
  • Title

    Filters for M class Phasor Measurement Units

  • Author

    Roscoe, Andrew J. ; Abdulhadi, Ibrahim F. ; Burt, Graeme M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
  • fYear
    2012
  • fDate
    26-28 Sept. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The new standard C37.118.1 lays down strict performance limits for phasor measurement units (PMUs) under steady-state and dynamic conditions. Reference algorithms are also presented for the P (performance) and M (measurement) class PMUs. In this paper, the performance of the Reference M class filter is analysed. Similarly to the Reference P class filter, the M class filter is found to have a relatively poor performance when the power system frequency is off-nominal. A different architecture for an M class Phasor Measurement Unit (PMU) algorithm is presented, and in particular a completely different design of M class filter. This is shown to have much improved rejection of unwanted harmonic and inter-harmonic components. This allows consistent accuracy to be maintained across a ±33% frequency range. ROCOF (Rate of Change of Frequency) errors can be reduced by factors of >;100.
  • Keywords
    IEEE standards; phasor measurement; power harmonic filters; C37.118.1 standard; M class phasor measurement units; dynamic conditions; inter-harmonic component; power system frequency; reference M class filter; reference P class filter; steady-state conditions; unwanted harmonic component; Filtering algorithms; Filtering theory; Finite impulse response filter; Harmonic analysis; Low pass filters; Phasor measurement units; Power harmonic filters; Fourier transforms; Frequency measurement; Phase estimation; Power system harmonics; Power system measurements; Power system parameter estimation; Power system stability; Power system state estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Measurements for Power Systems (AMPS), 2012 IEEE International Workshop on
  • Conference_Location
    Aachen
  • Print_ISBN
    978-1-4673-1540-1
  • Type

    conf

  • DOI
    10.1109/AMPS.2012.6343989
  • Filename
    6343989