Title :
Thermal analysis of high power LED array system
Author :
Zhang, Guangchen ; Feng, Shiwei ; Guo, Chunsheng ; Ge, Chenning ; Ding, Kaikai
Author_Institution :
Sch. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
Abstract :
It´s proved that the physical meaning of the electrical average temperature rise of series LED array system tested by electrical temperature sensitive parameter (TSP) method is the arithmetic mean of the temperature rises of all sub-LEDs in the system. Based on this relationship, a novel method to evaluate the temperature distribution of series LED systems by scan measurement and recursive calculation is proposed in this paper. Transient heating response measurements of GaN based high power LED arrays are presented to provide experimental verification for this method. The results show that this method is real-time valid and package form independent. The error between the results of individual measurement and this proposed method is less than ±2°C.
Keywords :
III-V semiconductors; arrays; gallium compounds; heating; light emitting diodes; power semiconductor diodes; recursion method; semiconductor device measurement; temperature distribution; temperature measurement; thermal analysis; wide band gap semiconductors; GaN; electrical average temperature rise; electrical temperature sensitive parameter method; high power LED array system; recursive calculation; scan measurement; series LED array; temperature distribution; thermal analysis; transient heating response; Decision support systems; Light emitting diodes; LED; electrical method; temperature distribution;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-9458-3
Electronic_ISBN :
1065-2221
DOI :
10.1109/STHERM.2010.5444274