Title :
Statistical analysis for brain EIT images using SPM
Author :
Zhang, Yan ; Passmore, Peter J. ; Yerworth, Rebecca J. ; Bayford, Richard H.
Author_Institution :
Sch. of Comput. Sci., Middllesex Univ., London, UK
Abstract :
Electrical impedance tomography (EIT) is a relatively new medical imaging method, which is based on the physiological property that different tissues have different impedances. EIT imaging of brain provides neuroimages by detecting functional impedance changes in the brain caused by cell swelling, blood volume and flow increase, and neuronal depolarisation. These changes are very subtle, therefore imaging analysis is usually needed to enhance the images. In this paper, statistical processing is adopted to analyse brain EIT images. The feasibility of using SPM (Statistical Parametric Mapping), a popular statistical software package used for neuroimages obtained by SPECT/PET or fMRI, to analyse simulated brain EIT images is studied. A scheme of utilizing SPM to interpret brain EIT data is presented. The experimental results suggest that it is reasonable to process brain EIT images with SPM.
Keywords :
brain; electric impedance imaging; medical image processing; neurophysiology; software packages; statistical analysis; Statistical Parametric Mapping; blood volume; brain images; cell swelling; electrical impedance tomography; functional impedance changes; image processing; medical imaging method; neuroimages; neuronal depolarisation; statistical software package; Biomedical imaging; Blood; Brain modeling; Cells (biology); Image analysis; Impedance; Positron emission tomography; Scanning probe microscopy; Software packages; Statistical analysis;
Conference_Titel :
Medical Information Visualisation - Biomedical Visualisation, 2005. (MediVis 2005). Proceedings. Third International COnference on
Print_ISBN :
0-7695-2393-5
DOI :
10.1109/MEDIVIS.2005.17
