• DocumentCode
    2024089
  • Title

    Interaction of scaling trends in processor architecture and cooling

  • Author

    Wei Huang ; Stan, M.R. ; Gurumurthi, Sudhanva ; Ribando, Robert J ; Skadron, Kevin

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    198
  • Lastpage
    204
  • Abstract
    It is predicted that two important trends are likely to accompany traditional CMOS semiconductor technology scaling - chip multiprocessors and 3D integration. With the ever-increasing power consumption and the consequent difficulty in heat removal, it is important to consider the limits and implications of different cooling methods for the upcoming many-core and 3D era. In this paper, we consider both technology scaling and many-core architecture scaling trends in conjunction with conventional air cooling and advanced microchannel cooling for both 2D and 3D microprocessors and identify interesting inflection design points down the road.
  • Keywords
    CMOS integrated circuits; cooling; logic design; microprocessor chips; three-dimensional integrated circuits; 2D microprocessors; 3D integration; 3D microprocessors; advanced microchannel cooling; air cooling; chip multiprocessors; cooling methods; heat removal; inflection design points; manycore architecture scaling trends; processor architecture; traditional CMOS semiconductor technology scaling; CMOS technology; Computer architecture; Computer science; Liquid cooling; Microchannel; Microprocessors; Moore´s Law; Parallel processing; Silicon; Transistors; 3D integration; Technology scaling; cooling solution; manycore architecture; processors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-9458-3
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2010.5444290
  • Filename
    5444290