• DocumentCode
    2024115
  • Title

    Hot spots and core-to-core thermal coupling in future multi-core architectures

  • Author

    Janicki, Marcin ; Collet, Jacques Henri ; Louri, Ahmed ; Napieralski, A.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Tech. Univ. of Lodz, Lodz, Poland
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    This paper studies hot spot and thermal coupling problems in future multicore architectures as CMOS technology scales from 65 nm feature size to 15 nm. We demonstrate that the thermal coupling between neighboring cores will dramatically increase as the technology scales to smaller feature sizes. The simulation studies were based on solving the heat equation using the analytical Green´s function method. Our simulations indicate that the thermal coupling in the 15 nm feature size just after 100 ms of operation will increase from 20% to 42% and in the steady state might reach even 65%. This finding uncovers a major challenge for the design of future multi-core architectures as the technology keeps scaling down. This will require a holistic approach to the design of future multi-core architectures encompassing low power computing, thermal management technologies and workload distribution.
  • Keywords
    CMOS integrated circuits; Green´s function methods; cores; coupled circuits; thermal management (packaging); CMOS technology; Green´s function method; core-to-core thermal coupling; holistic approach; hot spots; low power computing; multicore architectures; size 15 nm; size 65 nm; thermal management; workload distribution; Analytical models; CMOS technology; Computer architecture; Distributed computing; Energy management; Equations; Green´s function methods; Multicore processing; Steady-state; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-9458-3
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2010.5444291
  • Filename
    5444291