Title :
Product metrics for automatic identification of "bad smell" design problems in Java source-code
Author_Institution :
Strathclyde Univ., Glasgow
Abstract :
Refactoring can have a direct influence on reducing the cost of software maintenance through changing the internal structure of the source-code to improve the overall design that helps the present and future programmers evolve and understand a system. Bad smells are a set of design problems with refactoring identified as a solution. Locating these bad smells has been described as more a human intuition than an exact science. This paper addresses the issue of identifying the characteristics of a bad smell through the use of a set of software metrics. Then by using a pre-defined set of interpretation rules to interpret the software metric results applied to Java source-code, the software engineer can be provided with significant guidance as to the location of bad smells. These issues are addressed in a number of ways. Firstly, a precise definition of bad smells is given from the informal descriptions given by the originators Fowler and Beck. The characteristics of the bad smells have been used to define a set of measurements and interpretation rules for a subset of the bad smells. A prototype tool has been implemented to enable the evaluation of the interpretation rules in two case studies
Keywords :
Java; object-oriented programming; program diagnostics; reverse engineering; software maintenance; software metrics; Java source-code; bad smell design problems; object-oriented designs; product metrics; refactoring; software engineering; software maintenance; software metrics; source-code internal structure; system evolution; system understanding; Context modeling; Costs; Geometry; Multidimensional systems; Process planning; Productivity; Project management; Software engineering; Solid modeling; State estimation; CMMI; COCOMO; Estimation; Performance Management; QEST/LIME;
Conference_Titel :
Software Metrics, 2005. 11th IEEE International Symposium
Conference_Location :
Como
Print_ISBN :
0-7695-2371-4
DOI :
10.1109/METRICS.2005.3