• DocumentCode
    2024428
  • Title

    The merits of open bath immersion cooling of datacom equipment

  • Author

    Tuma, Phillip E

  • Author_Institution
    3M Center, 3M Co., St. Paul, MN, USA
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    123
  • Lastpage
    131
  • Abstract
    This paper discusses the economic and environmental merits of passive 2-phase immersion in semi-open baths of dielectric fluid for cooling datacom equipment such as servers. The technique eliminates the need for hermetic connectors, pressure vessels, seals and clamshells typically associated with immersion cooling and the connectors, plumping, pumps and cold plates associated with more traditional liquid cooling techniques. A board level power density of 11.7W/cm2 can be sustained with 100 cm3 of fluid per kW. The modular 80 kW baths modeled can eject 130 kW per m2 of floor space via water-cooled condensers. It is estimated that 28°C water at 15 gpm could maintain average CPU junction temperatures, Tj<;60°C and 62°C water at 30 gpm could maintain Tj<;85°C, maximizing the availability of the heat for other purposes. Alternatively, the heat can be transferred directly to ambient air without water as an intermediate. The costs and greenhouse gas emissions associated with conservative annual fluid emission estimates are found to be less than those associated with the electrical power required for traditional chassis fans and liquid pumps. Since these fugitive losses occur at one point, more efficient capture techniques can be easily applied.
  • Keywords
    cooling; data communication equipment; heat exchangers; datacom equipment; dielectric fluid; evaporative bath; fluoroketone; open bath immersion cooling; water-cooled condensers; Cold plates; Connectors; Dielectrics; Environmental economics; Immersion cooling; Power generation economics; Pumps; Seals; Water conservation; Water heating; 2-phase; cooling; data center; datacenter; datacom; evaporative bath; fluoroketone; immersion; open bath; passive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-9458-3
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2010.5444305
  • Filename
    5444305