DocumentCode
2024428
Title
The merits of open bath immersion cooling of datacom equipment
Author
Tuma, Phillip E
Author_Institution
3M Center, 3M Co., St. Paul, MN, USA
fYear
2010
fDate
21-25 Feb. 2010
Firstpage
123
Lastpage
131
Abstract
This paper discusses the economic and environmental merits of passive 2-phase immersion in semi-open baths of dielectric fluid for cooling datacom equipment such as servers. The technique eliminates the need for hermetic connectors, pressure vessels, seals and clamshells typically associated with immersion cooling and the connectors, plumping, pumps and cold plates associated with more traditional liquid cooling techniques. A board level power density of 11.7W/cm2 can be sustained with 100 cm3 of fluid per kW. The modular 80 kW baths modeled can eject 130 kW per m2 of floor space via water-cooled condensers. It is estimated that 28°C water at 15 gpm could maintain average CPU junction temperatures, Tj<;60°C and 62°C water at 30 gpm could maintain Tj<;85°C, maximizing the availability of the heat for other purposes. Alternatively, the heat can be transferred directly to ambient air without water as an intermediate. The costs and greenhouse gas emissions associated with conservative annual fluid emission estimates are found to be less than those associated with the electrical power required for traditional chassis fans and liquid pumps. Since these fugitive losses occur at one point, more efficient capture techniques can be easily applied.
Keywords
cooling; data communication equipment; heat exchangers; datacom equipment; dielectric fluid; evaporative bath; fluoroketone; open bath immersion cooling; water-cooled condensers; Cold plates; Connectors; Dielectrics; Environmental economics; Immersion cooling; Power generation economics; Pumps; Seals; Water conservation; Water heating; 2-phase; cooling; data center; datacenter; datacom; evaporative bath; fluoroketone; immersion; open bath; passive;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
Conference_Location
Santa Clara, CA
ISSN
1065-2221
Print_ISBN
978-1-4244-9458-3
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2010.5444305
Filename
5444305
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