Title :
Verification of a frequency dispersion model in the performance of a GaAs pHEMT travelling-wave MMIC
Author :
Kallfass, I. ; Zhang, C. ; Grünenputt, J. ; Teyssandier, C. ; Schumacher, H.
Author_Institution :
Dept. of Electron Devices & Circuits, Ulm Univ., Germany
Abstract :
The impact of frequency dispersive effects on typical figures of merit is investigated in a distributed MMIC realized in 0.15 /spl mu/m GaAs pHEMT technology. A novel compact dispersion model, allowing for accurate simulation of both static and dynamic multiple time constant IV characteristics, is employed. In a comparison of measurement and simulation, the model is both validated and used to quantify and interpret the error introduced when neglecting frequency dispersion in the design of MMICs. Device operation is investigated with respect to gain, linearity and power-added efficiency, all of them affected by dispersion effects. The model is shown to significantly improve simulation accuracy by increasing the validity range in terms of the frequency- and voltage regimes.
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC; gallium arsenide; travelling wave tubes; GaAs; frequency dispersion model; multiple time constant IV characteristics; pHEMT travelling-wave MMIC design; power-added efficiency; Bandwidth; Circuit topology; Dispersion; FETs; Feedback; Frequency; Gallium arsenide; MMICs; PHEMTs; Voltage;
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7