• DocumentCode
    2024604
  • Title

    Thermal performance of a Direct-Bond-Copper Aluminum Nitride manifold-microchannel cooler

  • Author

    Sharar, Darin J ; Jankowski, Nicholas R ; Morgan, Brian

  • Author_Institution
    Army Res. Lab., Adelphi, MD, USA
  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    68
  • Lastpage
    73
  • Abstract
    The presence of multiple thermally resistive layers in a standard power electronics package is a hindrance to thermal dissipation. By reducing the thermal stack and incorporating microchannel cold plates into the Aluminum Nitride substrate layer, significant improvement can be made. While parallel microchannel coolers have proved their faculty for single chip cooling, manifold microchannel coolers are explored for projected thermal and fluidic advantages for multi-chip modules aimed towards Hybrid Electric vehicles. This report outlines the fabrication, testing, and experimental results for a four-chip manifold microchannel cooler with water at 25°C and 80°C and three vehicular coolant fluids at 80°C with a maximum allowable pressure drop of 5 psig. Depending on the coolant fluid used, the total thermal stack resistivities ranged from 0.316-0.628 K-cm2/W at the 5 psig pressure limit. Potential for future research and module improvement is briefly discussed.
  • Keywords
    cooling; electronics packaging; microchannel flow; thermal conductivity; direct-bond-copper aluminum nitride manifold-microchannel cooler; multiple thermally resistive layers; power electronics package; temperature 25 degC; temperature 80 degC; thermal performance; Aluminum nitride; Cold plates; Coolants; Electronic packaging thermal management; Electronics cooling; Fabrication; Hybrid electric vehicles; Microchannel; Power electronics; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-9458-3
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2010.5444313
  • Filename
    5444313