Title :
Sidewall roughness and deformations in high index-contrast waveguides and photonic crystals
Author :
Poulton, G.G. ; Koos, C. ; Muller, M. ; Glöckler, F. ; Wang, J. ; Fujii, M. ; Leuthold, J. ; Freude, W.
Author_Institution :
Inst. of High-Frequency & Quantum Electron., Karlsruhe Univ., Germany
Abstract :
Design rules for low-loss waveguides with random perturbations are presented. For strip waveguides, the width should be chosen larger than 1/4 of the coherence length of the sidewall roughness. For an ensemble of perturbed 2D photonic crystal line defect waveguide bends, we give the statistics of the relative transmission.
Keywords :
deformation; optical design techniques; optical waveguide theory; photonic crystals; strip line discontinuities; surface roughness; coherence length; deformations; perturbed 2D photonic crystal line defect waveguide bends; sidewall roughness; strip waveguides; Attenuation; Design engineering; Glass; Loss measurement; Numerical models; Photonic crystals; Refractive index; Silicon; Strips; Virtual colonoscopy;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363559
