Title :
K-band capacitive MEMS-switches
Author :
Ulm, M. ; Walter, T. ; Mueller-Fiedler, R. ; Voigtlaender, K. ; Kasper, E.
Author_Institution :
Robert Bosch GmbH, Stuttgart, Germany
Abstract :
In this paper single-pole single-throw K-band microelectro-mechanical capacitive switches are discussed, exhibiting low insertion losses (<0.3 dB@21 GHz) and good isolation (34 dB@21 GHz). Depending on the respective geometry, an electromechanical characterization yields actuation voltages from 16 to 33 V and switching times around 10 /spl mu/s. Furthermore, resonance frequencies above 50 kHz have been measured. The switches are integrated in coplanar transmission lines on high resistivity silicon substrates. In order to be compatible with present semiconductor device technology, the fabrication process mainly employs copper and aluminum metallisations.
Keywords :
coplanar transmission lines; losses; micromechanical devices; microwave switches; reliability; silicon; 0.3 dB; 10 mus; 16 to 33 V; 21 GHz; Al; Al metallisation; Cu; Cu metallisation; K-band switches; SPST switches; Si; actuation voltages; capacitive MEMS-switches; coplanar transmission lines; electromechanical characterization; fabrication process; high resistivity Si substrates; insertion losses; microelectro-mechanical switches; single-pole single-throw switches; Coplanar transmission lines; Frequency measurement; Geometry; Insertion loss; K-band; Resonance; Resonant frequency; Switches; Transmission line measurements; Voltage;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000 Topical Meeting on
Conference_Location :
Garmisch, Germany
Print_ISBN :
0-7803-6255-1
DOI :
10.1109/SMIC.2000.844313