DocumentCode :
2024856
Title :
Looking for research results in thermal design, modeling, and application?
fYear :
2010
fDate :
21-25 Feb. 2010
Abstract :
You need to be using the IEEE??s database of over 1.9 million papers! Included are all the papers from SEMI-THERM, from I-THERM, some from THERMINIC, plus those from many mainline conferences (ECTC, EPTC, and ESTC) ?? all full-text searchable. Add to these the peer-reviewed thermal papers and Special Sections from all past issues of the IEEE??s Transactions, and you have a critical collection of useful content that can??t be matched elsewhere. There is no cost for searching the IEEE database for papers applicable to your area of research. And most major institutions and companies have full subscriptions to the database, allowing their faculty, staff and employees full, free access to PDFs of all the papers. To get started, visit: ieeexplore.ieee.org You can also do full-text search in scholar.google.com and scitopia.org ?? give them a try! Your organization doesn??t currently have a subscription to IEL/XPLORE? Then contact Paul Wesling (p.wesling@ieee.org) to discover the various, affordable access plans, from the full IEL to various Enterprise and Member-level plans. One will suit your research needs.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
Conference_Location :
Santa Clara, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4244-9458-3
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2010.5444323
Filename :
5444323
Link To Document :
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