DocumentCode :
2024961
Title :
Graph modeling for Static Timing Analysis at transistor level in nano-scale CMOS circuits
Author :
Rjoub, Abdoul ; Alajlouni, Almotasem Bellah
Author_Institution :
Comput. Eng. Dept., Jordan Univ. of Sci. & Technol., Irbid, Jordan
fYear :
2012
fDate :
25-28 March 2012
Firstpage :
80
Lastpage :
83
Abstract :
As a result of the evolution to nano-technology, the demand for accurate Static Timing Analysis (STA) at transistor level for high speed/high performance digital integrated circuits is increased. Despite the existence of many research attempts to resolve the timing analysis problems, (STA) remains the best solution because of the extremely fast run time and accuracy. The accurate modeling for highly resistive interconnects, nonlinear driver and receiver that effects in crosstalk noise analysis require accurate transistor level model. This model provides solution for false paths problem that is found in classic gate or arc models. In this paper, a new graph model is proposed at transistor level to describe the behavior of CMOS circuits. This model is dealing with CMOS circuit as a pool of transistors regardless its positions in the gates to overcome problem of false paths. By this model, accurate circuit timing analysis is estimated based on BSIM4 equations. Simulation results show the validity of the proposed graph model and its algorithms by using predictive Nano-Technology SPICE parameters for the tested circuits.
Keywords :
CMOS integrated circuits; SPICE; crosstalk; digital integrated circuits; graph theory; high-speed integrated circuits; integrated circuit interconnections; integrated circuit testing; nanoelectronics; timing; transistors; BSIM4 equations; STA; accurate static timing analysis; circuit timing analysis; crosstalk noise analysis; false paths problem; graph modeling; high performance digital integrated circuits; high speed digital integrated circuits; highly resistive interconnects; nanoscale CMOS circuits; nonlinear driver; predictive nanotechnology SPICE parameters; tested circuits; timing analysis problems; transistor level model; Delay; Integrated circuit modeling; Logic gates; Mathematical model; Semiconductor device modeling; Transistors; Critical path estimation; Graph models; MOSFETs; Transistor level; static Timing analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference (MELECON), 2012 16th IEEE Mediterranean
Conference_Location :
Yasmine Hammamet
ISSN :
2158-8473
Print_ISBN :
978-1-4673-0782-6
Type :
conf
DOI :
10.1109/MELCON.2012.6196385
Filename :
6196385
Link To Document :
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