• DocumentCode
    2025165
  • Title

    Simultaneous switching noise measurement on a CMOS chip on an MLC SCM

  • Author

    Becker, W.D. ; Christian, K. ; Katopis, G. ; Kuppinger, S. ; McCredie, B.

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    1994
  • fDate
    2-4 Nov 1994
  • Firstpage
    95
  • Lastpage
    97
  • Abstract
    The characterization of the simultaneous switching noise magnitude of 0.25 μm channel CMOS drivers obtained through high-frequency measurements is presented in this paper
  • Keywords
    CMOS integrated circuits; 0.25 micron; CMOS chip; CMOS drivers; MLC SCM; high-frequency measurements; simultaneous switching noise; CMOS technology; Circuit noise; Electrical resistance measurement; Noise measurement; Packaging; Performance evaluation; Probes; Semiconductor device measurement; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-2411-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1994.594096
  • Filename
    594096
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2025165