Title :
Electrical characteristics of multiconductor interconnects with perforated reference planes
Author :
Xue, Zhiyong ; Li, Zhenfan
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
Abstract :
A quasi-TEM approach is demonstrated for the equivalent transmission line characterization of multiconductor interconnects with perforated reference planes by using the “method of lines”. The proposed method can be used to obtain effective transmission line parameters for multiconductor interconnects
Keywords :
integrated circuit interconnections; electrical characteristics; equivalent transmission line; method of lines; multiconductor interconnects; perforated reference planes; quasi-TEM method; Capacitance; Distributed parameter circuits; Electric variables; Electromagnetic propagation; Equations; Geometry; Impedance; Integrated circuit interconnections; Multiconductor transmission lines; Transmission line matrix methods;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594097
