• DocumentCode
    2025205
  • Title

    Dynamic code coverage metrics: a lognormal perspective

  • Author

    Gokhale, Swapna S. ; Mullen, Robert E.

  • Author_Institution
    Connecticut Univ., Storrs, CT
  • fYear
    2005
  • fDate
    1-1 Sept. 2005
  • Lastpage
    33
  • Abstract
    The logical interrelationship between different code coverage types has been well studied, but less so their evolution through time or test. We study the dynamic relationship of four coverage types, namely, block, decision, c-use and p-use by comparing their growth using empirical coverage data generated from extensive testing of a software application with 35 KLOC of code. Our results indicate that as testing increases, the growth trends for each coverage type are surprisingly similar. Not only is each trend consistent with an underlying lognormal distribution of event rate, but also the parameters of the fitted lognormal distributions are closely related. Within the limits of the data, we find quantitative relations between the four coverage types. The paper thus takes a significant step in linking concepts from prior studies of software test sufficiency, test efficiency, and reliability in the context of software execution
  • Keywords
    log normal distribution; program diagnostics; program testing; software metrics; software reliability; dynamic code coverage metrics; lognormal distribution; quantitative relations; software reliability; software test efficiency; software test sufficiency; Application software; Costs; Flow graphs; Joining processes; Logic testing; Programming; Software reliability; Software testing; System testing; Code Coverage; Coverage types; Lognormal; Software Reliability Growth; Software Test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Metrics, 2005. 11th IEEE International Symposium
  • Conference_Location
    Como
  • ISSN
    1530-1435
  • Print_ISBN
    0-7695-2371-4
  • Type

    conf

  • DOI
    10.1109/METRICS.2005.17
  • Filename
    1509311