Title :
On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester
Author :
Aoki, Hideyuki ; Ikeda, Makalo ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ., Japan
Abstract :
With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.
Keywords :
CMOS integrated circuits; VLSI; analogue-digital conversion; comparators (circuits); electric noise measurement; integrated circuit measurement; integrated circuit testing; power supply circuits; signal processing equipment; voltage measurement; CMOS test chip; VLSI power supply noise; digital tester; driving NAND gate; on-chip voltage noise monitor; power supply lines; sampling method; time resolution; voltage bounce measurement; voltage bounce noise; voltage comparator circuit; Circuit noise; Circuit testing; Integrated circuit interconnections; Monitoring; Noise measurement; Pins; Power measurement; Power supplies; Semiconductor device measurement; Voltage measurement;
Conference_Titel :
Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on
Print_ISBN :
0-7803-6275-7
DOI :
10.1109/ICMTS.2000.844416
