• DocumentCode
    2025832
  • Title

    Generation of third and higher-order intermodulation products in MEMS capacitors, and their effects

  • Author

    Girbau, David ; Otegi, Nerea ; Pradell, Lluís ; Lázaro, Antonio

  • Author_Institution
    Dept. of Signal Theory & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
  • fYear
    2005
  • fDate
    3-4 Oct. 2005
  • Firstpage
    593
  • Lastpage
    596
  • Abstract
    In this work, the intermodulation distortion (IMD) produced by RF MEMS capacitors is studied. It is demonstrated that due to their non-linear behaviour, parallel-plate MEMS capacitors generate 5/sub th/ order tones along with 3/sub rd/ order IMD products. It is shown that MEMS linear models, restricted to small displacements of the MEMS membrane, neglect 5/sub th/ order distortion while underestimate 3/sub rd/ order tones, when high voltages are considered. A numerical non-linear model for simulating intermodulation is presented and validated by means of measurements for the general 2-tone case. Generation of 3/sub rd/ and 5/sub th/ IMD products is also demonstrated in MEMS driven by digitally-modulated communication signals. A measurement system is proposed in order to characterize IMD generation in RF MEMS capacitors excited by two RF tones as well as by digitally-modulated signals (QPSK).
  • Keywords
    capacitors; intermodulation distortion; micromechanical devices; quadrature phase shift keying; QPSK; RF MEMS capacitors; RF tones; digitally-modulated communication signals; higher-order intermodulation products; intermodulation distortion; numerical nonlinear model; parallel-plate MEMS capacitors; third-order intermodulation products; Biomembranes; Capacitors; Distortion measurement; Intermodulation distortion; Micromechanical devices; Nonlinear distortion; Numerical models; Radiofrequency microelectromechanical systems; Signal generators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
  • Conference_Location
    Paris
  • Print_ISBN
    88-902012-0-7
  • Type

    conf

  • Filename
    1637288