DocumentCode :
2026180
Title :
Extensions to the contour integral method for efficient modeling of TM scattering in two-dimensional photonic crystals
Author :
Preibisch, Jan Birger ; Duan, Xiaohua ; Schuster, Christian
Author_Institution :
Inst. for Electromagn. Theor., Tech. Univ. Hamburg-Harburg, Hamburg, Germany
fYear :
2013
fDate :
16-21 Sept. 2013
Firstpage :
493
Lastpage :
495
Abstract :
We present an extension to the contour integral method (CIM) for the treatment of two-dimensional scattering problems from circular inclusions with plane wave excitation. CIM is an integral equation approach to planar problems whose efficiency can be greatly enhanced by semi-analytical treatment of circular scatterers. It is related to the boundary element method (BEM) and shows promising domain decomposition capabilities. The performance and accuracy is compared to the full-wave finite integral technique (FIT) by studying the scattering of an array of dielectric rods.
Keywords :
dielectric materials; integral equations; light scattering; photonic crystals; TM scattering modeling; boundary element method; circular scatterers; contour integral method; dielectric rod array; domain decomposition capabilities; full-wave finite integral technique; plane wave excitation; two-dimensional photonic crystals; two-dimensional scattering problems; Computer integrated manufacturing; Dielectrics; Electromagnetics; Impedance; Microwave circuits; Optical waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2013 7th International Congress on
Conference_Location :
Talence
Print_ISBN :
978-1-4799-1229-2
Type :
conf
DOI :
10.1109/MetaMaterials.2013.6809097
Filename :
6809097
Link To Document :
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