Title :
A statistical fire judgment system for the time series of smoke density using gradient histogram
Author :
Tsuruoka, Shinji ; Wakabayashi, Nobukazu ; Yoshikawa, Tomohiro
Author_Institution :
Dept. of Electr. & Electron. Eng., Mie Univ., Tsu, Japan
Abstract :
We propose a statistical fire judgment system by a new feature extraction for the time series of smoke density in an early stage. We focus on the gradient of the time series, and we quantize the time series into a gradient histogram of 32 dimensional vector. We use the gradient histogram as a feature vector, and we compared the fire judgment rates with five criteria (Euclidean distance, simple similarity, multiple similarity, Mahalanobis´ distance, and modified Bayes discriminant function) as a statistical discriminant function. We evaluated experimentally the efficiency of proposed methods for actual 233 unknown time series, where the average of the correct judged rate is 60% using the conventional rule. The correct judged rates are 74% for Euclidean distance, 75% for simple similarity, 83% for multiple similarity, 83% for Mahalanobis´ distance, and 85% for a modified Bayes discriminant function. By the comparison of the previous feature, it appears that the proposed feature reduced the false alarm rate from 19% to 14%
Keywords :
alarm systems; feature extraction; fires; signal processing; smoke; 32 dimensional vector gradient histogram; Euclidean distance; Mahalanobis´ distance; feature extraction; fire alarm facility; intelligent fire judgment system; modified Bayes discriminant function; multiple similarity; signal processing; simple similarity; smoke density; statistical discriminant function; statistical fire judgment system; statistical pattern recognition; time series gradient; Dictionaries; Eigenvalues and eigenfunctions; Euclidean distance; Feature extraction; Fires; Histograms; Intelligent sensors; Intelligent systems; Pattern recognition; Signal processing;
Conference_Titel :
Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
Conference_Location :
Nagoya
Print_ISBN :
0-7803-6456-2
DOI :
10.1109/IECON.2000.972366