DocumentCode :
2026312
Title :
Fast 3D Face Alignment and Improved Recognition Through Pyramidal Normal map Metric
Author :
Abate, Andrea F. ; Nappi, Michele ; Ricciardi, Stefano ; Sabatino, Gabriele
Author_Institution :
Univ. degli Studi di Salerno, Fisciano
Volume :
1
fYear :
2007
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
Face´s tri-dimensional shape represents a highly discriminating yet challenging biometric identifier due to different issues, some of which related to capture, alignment and normalization. This paper presents an improved normal map based face recognition approach, which relies on a novel method to automatically align a captured 3D face mesh to a reference template, allowing a more precise face comparison. The alignment algorithm exploits pyramidal-normal-map metric, a coarse to finer measurement of angular distance between two surfaces computed through normal maps with progressively increasing resolution. After the registration has been performed, the normalized face can be rapidly compared to any other template in the gallery database for authentication or identification purposes using standard normal map metric. The alignment approach avoids the need for a rough or manual face pre-alignment and maximizes recognition precision, requiring a fraction of the time needed by the iterative closest point (ICP) method to operate. We show preliminary experimental results on a 3D dataset featuring 235 different subjects.
Keywords :
face recognition; image registration; image representation; image resolution; iterative methods; visual databases; 3D face alignment; 3D face mesh; angular distance measurement; biometric identifier; face recognition approach; gallery database; iterative closest point method; pyramidal normal map metric; Biometrics; Databases; Face recognition; Image recognition; Iterative closest point algorithm; Iterative methods; Principal component analysis; Rough surfaces; Shape; Surface roughness; Face recognition; image processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2007.4378915
Filename :
4378915
Link To Document :
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