Title :
Characterisation of aluminium passivation for TMAH based anisotropic etching for MEMS applications
Author :
Lian, Knut ; Smith, Stcwart ; Rankin, N. ; Walton, A.J. ; Gundlach, Alan ; Stevenson, Tom
Author_Institution :
Dept. of Electron. & Electr. Eng., Edinburgh Univ., UK
Abstract :
A cross-bridge linewidth test structure has been used to analyse, both electrically and physically, the effect of a new anisotropic silicon etch composition that has been designed to have an increased selectivity with aluminium. To characterise the effect of the etch on aluminium tracks, electrical measurements have been made to obtain sheet resistance and linewidth. These results are presented in combination with SEM micrographs to evaluate the surface quality of the exposed aluminium.
Keywords :
aluminium; etching; micromachining; micromechanical devices; passivation; silicon; Al; Al passivation characterisation; Al-Si; MEMS applications; SEM micrographs; Si; TMAH based anisotropic etching; anisotropic Si etch composition; cross-bridge linewidth test structure; electrical measurements; etchant selectivity; linewidth; sheet resistance; surface quality evaluation; Aluminum; Anisotropic magnetoresistance; Electric resistance; Electric variables measurement; Electrical resistance measurement; Etching; Micromechanical devices; Passivation; Silicon; Testing;
Conference_Titel :
Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on
Print_ISBN :
0-7803-6275-7
DOI :
10.1109/ICMTS.2000.844433
