Investigation of achievable accuracy limit of dielectric layer parameters estimates obtained on basis of reflection coefficient measurements

Author

Drobakhin, O.O. ; Aleksin, S.G.

Author_Institution

Dept. of Phys., Electron. & Comput. Syst., Dniepropetrovsk Nat. Univ., Dniepropetrovsk, Ukraine

fYear

2012

fDate

24-27 Sept. 2012

Firstpage

41

Lastpage

44

Abstract

Minimum, mean and maximum value of the least achievable variance of dielectric layer parameters estimates are evaluated for typical microwave frequency bands used in practice of nondestructive testing. The values of variance are calculated as Cramér-Rao bounds depending on permittivity and thickness of dielectric layer and parameters of frequency grid. The bounds are compared with result of statistical numeric experiment carried out for the purpose of estimation of permittivity and thickness estimates variance provided by quasisolution method.

Keywords

dielectric materials; permittivity; permittivity measurement; statistical analysis; Cramer-Rao bound; dielectric layer parameter; frequency grid; microwave frequency band; nondestructive testing; permittivity; quasisolution method; reflection coefficient measurement; statistical numeric experiment; Dielectrics; Frequency measurement; Noise; Noise measurement; Permittivity; Permittivity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), 2012 XVIIth International Seminar/Workshop on

Conference_Location

Tbilisi

ISSN

2165-3585

Print_ISBN

978-1-4673-2253-9

Type

conf

Filename

6344093