Title :
Thermal aware output polarity selection of programmable logic arrays
Author :
Das, Apangshu ; Pradhan, Sambhu Nath
Author_Institution :
Electron. & Commun. Eng. Dept., Nat. Inst. of Technol. Agartala, Agartala, India
Abstract :
Intensive scaling and large number of logic blocks embedded within a VLSI chip results increased power-densities. Power-density directly converging into temperature which reduces the yield of the circuit. Adverse affect of power-density reduction is increase in area So, there is a trade-offs between area and power-density. Previous works has been done on the polarity selection of outputs of programmable logic arrays (PLA) for its reduced area or low power realization. In this paper, we present a heuristic based on genetic algorithm to increase the sharing of product terms in multi-output PLA by selecting the proper output polarity and a suitable area and power-density trade-off has been enumerated. This is the first ever effort to incorporate the power-density in polarity selection process. The proposed algorithm has been validated with the LGSynth93 benchmark circuit. A comparative study of our approach is done with `espresso´ and `espresso-Dopo´ methodology. We obtained 17.53% (26.69%) improvement in area (power-density) with respect to `espresso´. Also 7.87% in area and 27.95% in power-density with respect to `espresso-Dopo´ has been reported in this paper.
Keywords :
VLSI; genetic algorithms; integrated circuit yield; programmable logic arrays; LGSynth93 benchmark circuit; PLA; VLSI chip; area-power density trade-off; circuit yield reduction; espresso-Dopo methodology; genetic algorithm; intensive scaling; logic blocks; low-power realization; polarity selection process; power-density reduction; programmable logic arrays; thermal-aware output polarity selection; Biological cells; Genetic algorithms; Minimization; Programmable logic arrays; Sociology; Statistics; Very large scale integration; PIA; area power-density trade-offs; genetic algorithm; output polarity selection; power-density;
Conference_Titel :
Electronic Design, Computer Networks & Automated Verification (EDCAV), 2015 International Conference on
Conference_Location :
Shillong
Print_ISBN :
978-1-4799-6207-5
DOI :
10.1109/EDCAV.2015.7060541