Title :
Fast Statistical Learning with Kernel-Based Simple-FDA
Author :
Nakaura, K. ; Karungaru, S. ; Akashi, T. ; Mitsukura, Y. ; Fukumi, M.
Author_Institution :
Univ. of Tokushima, Tokushima, Japan
fDate :
Nov. 30 2008-Dec. 3 2008
Abstract :
In this paper, new statistical learning algorithms with kernel function are presented. Recently, iterative learning algorithms for obtaining eigenvectors in the principal component analysis (PCA) have been presented in the field of pattern recognition and neural network. However, the Fisher linear discriminant analysis (FLDA) has been used in many fields, especially face image analysis. The drawback of FLDA is a long computational time based on a large-sized covariance matrix and the issue that the within-class covariance matrix is usually singular. In order to overcome this difficulty, we proposed the feature generation method simple-FLDA which is approximately derived from geometrical interpretation of FLDA. This algorithm is similar to simple-PCA and does not need matrix operation. In this paper, new statistical kernel based learning algorithms are presented. They are extended versions of simple-PCA and simple-FLDA to nonlinear space using the kernel function. Their preliminary simulation results are given for a simple face recognition problem.
Keywords :
covariance matrices; learning (artificial intelligence); principal component analysis; Fisher linear discriminant analysis; face image analysis; fast statistical learning; iterative learning algorithms; kernel function; large-sized covariance matrix; principal component analysis; Covariance matrix; Face recognition; Image analysis; Iterative algorithms; Kernel; Linear discriminant analysis; Neural networks; Pattern recognition; Principal component analysis; Statistical learning; Simple-FDA; face recognition; kernel function; pattern recognition; statistical learning;
Conference_Titel :
Signal Image Technology and Internet Based Systems, 2008. SITIS '08. IEEE International Conference on
Conference_Location :
Bali
Print_ISBN :
978-0-7695-3493-0
DOI :
10.1109/SITIS.2008.52