DocumentCode
2026921
Title
Neural fractal prediction of three dimensional surface roughness
Author
Wang, Xin ; Petriu, Emil M.
Author_Institution
Distrib. & Collaborative Virtual Environments Res. Lab. (DISCOVER), Univ. of Ottawa, Ottawa, ON, Canada
fYear
2011
fDate
19-21 Sept. 2011
Firstpage
1
Lastpage
4
Abstract
This paper presents a methodology for using the high resolution three dimensional (3D) surface data of fabric samples to acquire their surface roughness parameter measurement. Firstly, we compute a parameter FDFFT, which is the fractal dimension estimated from the two-dimensional fast Fourier transform (2DFFT) of 3D surface scan. We validate the rotation-invariance and scale-invariance of FDFFT using fractal Brownian images. Secondly, in order to evaluate the correctness of FDFFT, we provide a method of calculating standard roughness parameters from 3D fabric surface. According to the test results, we demonstrated that FDFFT is a fast and reliable parameter for fabric roughness measurement based on 3D surface data. Finally, we attempt a neural network model using back propagation algorithm and FDFFT for predicting the standard roughness parameters. The proposed neural network model shows good performance to both training samples and test samples.
Keywords
backpropagation; fabrics; fast Fourier transforms; fractals; inspection; neural nets; production engineering computing; stereo image processing; surface roughness; surface topography measurement; 2D fast Fourier transform; 3D fabric surface; 3D surface roughness; 3D surface scan; back propagation algorithm; fractal Brownian image; fractal dimension estimation; high resolution 3D surface data; inspection; neural fractal prediction; neural network model; rotation invariance; scale invariance; surface roughness parameter measurement; Fabrics; Fractals; Optical surface waves; Predictive models; Rough surfaces; Surface roughness; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Measurement Systems and Applications (CIMSA), 2011 IEEE International Conference on
Conference_Location
Ottawa, ON, Canada
ISSN
2159-1547
Print_ISBN
978-1-61284-924-9
Type
conf
DOI
10.1109/CIMSA.2011.6059937
Filename
6059937
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