• DocumentCode
    2026921
  • Title

    Neural fractal prediction of three dimensional surface roughness

  • Author

    Wang, Xin ; Petriu, Emil M.

  • Author_Institution
    Distrib. & Collaborative Virtual Environments Res. Lab. (DISCOVER), Univ. of Ottawa, Ottawa, ON, Canada
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a methodology for using the high resolution three dimensional (3D) surface data of fabric samples to acquire their surface roughness parameter measurement. Firstly, we compute a parameter FDFFT, which is the fractal dimension estimated from the two-dimensional fast Fourier transform (2DFFT) of 3D surface scan. We validate the rotation-invariance and scale-invariance of FDFFT using fractal Brownian images. Secondly, in order to evaluate the correctness of FDFFT, we provide a method of calculating standard roughness parameters from 3D fabric surface. According to the test results, we demonstrated that FDFFT is a fast and reliable parameter for fabric roughness measurement based on 3D surface data. Finally, we attempt a neural network model using back propagation algorithm and FDFFT for predicting the standard roughness parameters. The proposed neural network model shows good performance to both training samples and test samples.
  • Keywords
    backpropagation; fabrics; fast Fourier transforms; fractals; inspection; neural nets; production engineering computing; stereo image processing; surface roughness; surface topography measurement; 2D fast Fourier transform; 3D fabric surface; 3D surface roughness; 3D surface scan; back propagation algorithm; fractal Brownian image; fractal dimension estimation; high resolution 3D surface data; inspection; neural fractal prediction; neural network model; rotation invariance; scale invariance; surface roughness parameter measurement; Fabrics; Fractals; Optical surface waves; Predictive models; Rough surfaces; Surface roughness; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence for Measurement Systems and Applications (CIMSA), 2011 IEEE International Conference on
  • Conference_Location
    Ottawa, ON, Canada
  • ISSN
    2159-1547
  • Print_ISBN
    978-1-61284-924-9
  • Type

    conf

  • DOI
    10.1109/CIMSA.2011.6059937
  • Filename
    6059937