DocumentCode :
2027706
Title :
Effect of the MOSFET choice on conducted EMI in power converter circuits
Author :
Ben Hadj Slama, Jaleleddine ; Tlig, M.
Author_Institution :
Nat. Eng. Sch. of Sousse (ENISO), Univ. of Sousse, Sousse, Tunisia
fYear :
2012
fDate :
25-28 March 2012
Firstpage :
610
Lastpage :
613
Abstract :
The phase of virtual prototyping, which is usually based on a whole of numerical simulations of the system, requires today to have thin suitable models. These models must take in account the real behavior of the systems under various physical constraints (thermal, electromagnetic...). Particularly, in this work, we are interested to the study of the effect of the Mosfet transistor choice on the conducted electromagnetic interferences emitted by static converters circuits. The objective of this work is to propose a new design methodology which will permit to assist the power electronics circuit designer in the choice of the active components with the purpose of reducing the electromagnetic disturbances.
Keywords :
electromagnetic interference; integrated circuit design; numerical analysis; power MOSFET; power convertors; power electronics; MOSFET transistor; active component; conducted EMI; conducted electromagnetic interference; design methodology; electromagnetic constraint; electromagnetic disturbance; numerical simulation; physical constraints; power converter circuit; power electronics circuit; static converters circuit; thermal constraint; virtual prototyping; Electromagnetic compatibility; Electromagnetic interference; Electromagnetics; Integrated circuit modeling; MOSFET circuits; Transistors; Voltage measurement; EMC; Interferences; LSIN; Model; Mosfet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference (MELECON), 2012 16th IEEE Mediterranean
Conference_Location :
Yasmine Hammamet
ISSN :
2158-8473
Print_ISBN :
978-1-4673-0782-6
Type :
conf
DOI :
10.1109/MELCON.2012.6196505
Filename :
6196505
Link To Document :
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