• DocumentCode
    2027973
  • Title

    A 5GHz WLAN amplifier with novel on-chip positive voltage switchable bias implemented in a D-pHEMT process

  • Author

    Boglione, Luciano ; Paradis, Jerry

  • Author_Institution
    Eng. Technol., Univ. of Massachusetts Lowell, Lowell, MA, USA
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 1 2009
  • Firstpage
    472
  • Lastpage
    475
  • Abstract
    This paper presents the RF characterization of a 4.9-5.9 GHz microwave amplifier for WLAN applications with a novel on-chip positive voltage switchable bias implemented in a depletion p-HEMT process. In order to assess the impact of the novel bias network on the amplifier´s RF performance, a second amplifier without DC switch has also been designed and tested. Both amplifiers are biased at the same collector current value. Full characterization of both designs has been carried out vs. frequency, bias conditions and control voltage VC for the DC switchable amplifier at room temperature. The results demonstrate that the DC switch does not degrade the linear gain and return loss. The switch impact on the linearity performance is limited and still allows for a highly linear design. To the authors´ knowledge, DC switching capability driven by a positive voltage has never been reported in normally on, D-FET based, monolithic microwave integrated circuits.
  • Keywords
    DC amplifiers; HEMT integrated circuits; microwave power amplifiers; power HEMT; radiofrequency amplifiers; wireless LAN; D-pHEMT process; DC switchable amplifier; RF characterization; RF performance; VC switchable amplifier; WLAN amplifier; depletion p-HEMT; frequency 4.9 GHz to 5.9 GHz; linearity performance; microwave amplifier; on-chip positive voltage switchable bias; Degradation; Gain; Microwave amplifiers; Radio frequency; Radiofrequency amplifiers; Switches; Temperature control; Testing; Voltage control; Wireless LAN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. EuMC 2009. European
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-4748-0
  • Type

    conf

  • Filename
    5296550