DocumentCode :
2028533
Title :
Investigation of DVFS based dynamic reliability management for chip multiprocessors
Author :
Moghaddam, Milad Ghorbani ; Yamamoto, Alexandre ; Ababei, Cristinel
Author_Institution :
Marquette Univ., Milwaukee, WI, USA
fYear :
2015
fDate :
20-24 July 2015
Firstpage :
563
Lastpage :
568
Abstract :
We investigate dynamic voltage and frequency scaling (DVFS) as a mechanism for dynamic reliability management (DRM) of chip multiprocessors (CMPs). The proposed DRM scheme operates as a control technique whose objective is to drive the operation of the CMP such that reliability changes towards a desired target. While the chip multiprocessor is continuously monitored and reliability is estimated in real time, the voltage and frequency of different cores in the CMP are dynamically adjusted such that reliability converges towards the target. When the temperature of cores increases and thus reliability degrades, the proposed DRM scheme throttles selectively the frequency of the cores with the highest temperature. This is turn, leads to a lower power dissipation in those cores whose temperature decreases, thereby improving reliability. We leverage existing simulation and estimation tools to develop the proposed DRM scheme. Simulations results show that the proposed DRM scheme provides an effective way to tradeoff reliability and performance.
Keywords :
circuit reliability; microprocessor chips; multiprocessing systems; DVFS based dynamic reliability management; chip multiprocessors; dynamic voltage and frequency scaling; Benchmark testing; Estimation; Frequency control; Frequency estimation; Management; Multicore processing; Reliability; chip multiprocessors; dynamic reliability management; dynamic voltage and frequency scaling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing & Simulation (HPCS), 2015 International Conference on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-7812-3
Type :
conf
DOI :
10.1109/HPCSim.2015.7237093
Filename :
7237093
Link To Document :
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