DocumentCode :
2028784
Title :
Two dimensional PIC simulation of a Langmuir probe in a plasma beam
Author :
Keefer, D.R. ; Markusic, T.
Author_Institution :
Center for Laser Applications, Tennessee Univ. Space Inst., Tullahoma, TN, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
95
Abstract :
Summary form only given, as follows. A 2d/3v electrostatic particle-in-cell (PIC) code has been developed to simulate a Langmuir probe in a plasma beam. The code was written to enable the use of the Langmuir probe in plasma regimes for which no closed-form analytical solutions exist; this is the case for a probe in an ion beam, such as the plume of an ion thruster. Langmuir probes are used to determine local plasma properties, such as electron temperature, by careful dissection of the probe´s V-I characteristic. To interpret experimental data from a Langmuir probe, one must separate ion from electron current. This process is well documented for quiescent plasmas; however, no systematic techniques are available for interpreting data obtained using an electric probe in an ion beam ad hoc estimates of probe ion current in beam plasmas may lead to order of magnitude errors in the calculation of electron temperature. The PIC code described in this paper was written to elucidate the beam-probe interaction and provide systematic techniques for legitimately interpreting experimental data. Elements of the PIC technique in general will be discussed; in particular, methods used in fluxing particles across boundaries. Code results will be presented. Code and theoretical probe traces for an infinite cylindrical probe in a quiescent plasma will be shown to be in agreement. Also, code results for a plasma beam will be compared with experimental data from the UTSI three-grid ion thruster.
Keywords :
Langmuir probes; plasma diagnostics; plasma properties; plasma simulation; plasma temperature; temperature; Langmuir probe; closed-form analytical solutions; electron current; electron temperature; electrostatic particle-in-cell code; infinite cylindrical probe; ion beam; ion thruster; local plasma properties; plasma beam; probe ion current; quiescent plasma; quiescent plasmas; Electrons; Ion beams; Laser beams; Particle beams; Plasma applications; Plasma diagnostics; Plasma properties; Plasma simulation; Plasma temperature; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.529658
Filename :
529658
Link To Document :
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