• DocumentCode
    2028974
  • Title

    In-situ experimental investigations of electron space-charge instabilities and noise mechanisms in a reentrant crossed-field amplifier via distributed-cathode emission and gated-beam injection

  • Author

    Ye, J.Z. ; MacGregor, R. ; Chung Chan ; Ruden, T.E.

  • Author_Institution
    Plasma Sci. Lab., Northeastern Univ., Boston, MA, USA
  • fYear
    1995
  • fDate
    5-8 June 1995
  • Firstpage
    98
  • Abstract
    Summary form only given. Experimental investigations of the true physical conditions inside the crossed-field devices are of fundamental importance for the understanding of the operation of these devices and may lead to eventual improvement of the present tubes. At Northeastern University, tube research has taken up a combined approach of in situ plasma diagnostics and computer simulations using two frequency scaled CFAs as test vehicles. A collection of temporal and time-averaged diagnostic techniques have been developed through our research. Probe measurements as well as device performance of the linear CFA and the beam-injected, reentrant CFA have been directly compared with computer simulation results from MASK and NEAMP codes. We have recently incorporated in our reentrant CFA a secondary emission cathode for the purpose of gaining insight on improving the noise performance of both military and commercial devices. It has long been speculated and appears more so as a result of the improved diagnostic techniques, that the instabilities in the space charge cloud are the major source of noise in crossed-field devices. The average electron transit time is determined experimentally through a gated-electron injection scheme. Latest results are reported.
  • Keywords
    cathodes; electromagnetic oscillations; electron device noise; microwave tubes; random noise; space charge; stability; MASK code; NEAMP code; applied RF drive signal; average electron transit time; computer simulations; distributed-cathode emission; electron cloud; electron space-charge instabilities; gated-beam injection; in situ plasma diagnostics; noise mechanisms; reentrant crossed-field amplifier; secondary emission cathode; space charge oscillations; static operating regimes; time-averaged density measurements; turbulent behaviour; Cathodes; Computer simulation; Electrons; Frequency; Military computing; Plasma diagnostics; Plasma measurements; Probes; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
  • Conference_Location
    Madison, WI, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-2669-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1995.529665
  • Filename
    529665