Title :
Transaction-level error susceptibility for bus-based System-on-Chip: From single-bit to multi-bit
Author :
Zheng, Shi-Qun ; Lin, Chao
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
System-on-Chip architectures have traditionally relied upon bus-based interconnect for their communication needs. The increasing bus frequencies and load on the bus calls for focus on reliability issues in such bus-based systems. As technology advances and transistor geometry shrinks, both single-bit and multi-bit error rate increase significantly. The scant research on mulit-bit errors calls for more attention about them. In this paper, we compare the consequences of a single-bit and multi-bit error and provide a detail analysis of a multi-bit error on the bus system during the course of different transactions. Such transaction based analysis helps us to develop an effective prediction methodology to predict the effect of a multi-bit error on any application running on a bus based architecture. We demonstrate that our transaction based prediction scheme works with an average accuracy of 88% over all the benchmarks when compared with the actual simulation results.
Keywords :
computational geometry; computer architecture; reliability; system-on-chip; bus based system-on-chip; reliability issues; system-on-chip architectures; transaction level error susceptibility; transistor geometry; Accuracy; Benchmark testing; Computer architecture; Error analysis; Protocols; System recovery; System-on-a-chip;
Conference_Titel :
Computer Symposium (ICS), 2010 International
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-7639-8
DOI :
10.1109/COMPSYM.2010.5685428